Topical day on radiation tolerant instrumentation: from transistor to integrated systems

09:45

H. Aït Abderrahim

SCK•CEN

Welcome and introduction

10:00

E. Simoen

IMEC

Impact of innovative materials and device architectures on the radiation response of deep submicon CMOS technologies

10:45

G. Berger

UCL

A methodology to simulate soft error transients from technology to circuits in bulk and SOI CMOS

COFFEE BREAK

11:45

S. Girard

CEA-DIF

Fibre optic components for communication and instrumentation purposes in nuclear environments

LUNCH

13:45

P. Leroux

SCK•CEN/KHK

Fission and Fusion applications
The design of radiation tolerant integrated circuits for miniaturized instrumentation in future nuclear reactor environments

14:30

E. Heijne

CERN

Applications in CERN. Dealing with chips in the LHC at CERN, a 'cosmic ray' source on earth

COFFEE BREAK

15:45

L. Dusseau

University of Montpellier

Circuit and Synergy effects in linear devices for space applications

16:30

R. Schrimpf

Vanderbilt University

Single-Event Rate Prediction in Advanced IC Technologies

17:15

M. Van Uffelen

SCK•CEN

Conclusion

SUMMARY

RECEPTION